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• #Nickel oxide x ray diffraction pattern iso#

While diffraction is commonly used for quantification of multiphase mixtures, using it to quantify the amorphous-component fraction of unknown samples has only become possible with the certification of NIST SRMs for absolute phase purity.

#Nickel oxide x ray diffraction pattern iso#

One of the leading instrument companies uses this SRM for ISO certification of equipment used in the pharmaceutical industry. SRM 640e is also a renewal SRM 640, silicon powder, was the first NIST SRM for powder diffraction and has traditionally been very popular. The SRM is certified with respect to the lattice parameter of the Si substrate. It consists of 25 mm x 25 mm pieces of a silicon wafer with a Si-Ge epilayer. The new SRM 2000 is the first thin-film, high-resolution diffraction SRM. SRM 1976b features a more uniform microstructure that, in turn, results in reduced error bounds on the certified values. The new SRM 1976b is the successor to SRM 1976, which, since its introduction in 1991, has become the best selling of the diffraction metrology SRMs.

Improvements in SRM 676a include an alumina powder (feedstock) of higher phase-purity, as well as a more accurate certification of its phase content. SRM 676a is the renewal of SRM 676, an alumina powder certified for quantitative analysis of multiphase mixtures. The measurement technology associated with the certification procedures for the entire suite of diffraction metrology SRMs is continuously being improved.